“structure factor”的概念、定义、翻译、参考文献-科学参考

structure factor

Chemistry

A quantity that is measured in scattering experiments and that gives information about the structure of the material. In the case of a crystal it is denoted F_hkl, where h, k, and l are the Miller indices of the crystal. F_hkl is defined by the equation:
$F_{h k l} = \sum_{i} f_{i} exp [2 π i (h x_{i} + k y_{i} + l z_{i})],$
where the sum is over all atoms of the unit cell and f_i is the scattering factor for atom i defined by:
$f_{i} = 4 π ∫_{0}^{\infty} (ρ \sin k r / k r) r^{2} d r,$
where k = 4πsinθ/λ‎, where θ‎ is the Bragg angle (see Bragg’s law), λ‎ is the wavelength of the X-rays, and ρ‎ is the electron density distribution of the atom i. The structure factor is used extensively in X-ray crystallography. It is also used widely in the theory of liquids, as it is related to the radial distribution function. In X-ray crystallography the square of the modulus of the structure factor for a set of crystal planes with Miller indices h, k, l is proportional to the intensity of reflection from these planes.

单词	structure factor
释义	structure factor Chemistry A quantity that is measured in scattering experiments and that gives information about the structure of the material. In the case of a crystal it is denoted F_hkl, where h, k, and l are the Miller indices of the crystal. F_hkl is defined by the equation: $F_{h k l} = \sum_{i} f_{i} exp [2 π i (h x_{i} + k y_{i} + l z_{i})],$ where the sum is over all atoms of the unit cell and f_i is the scattering factor for atom i defined by: $f_{i} = 4 π ∫_{0}^{\infty} (ρ \sin k r / k r) r^{2} d r,$ where k = 4πsinθ/λ‎, where θ‎ is the Bragg angle (see Bragg’s law), λ‎ is the wavelength of the X-rays, and ρ‎ is the electron density distribution of the atom i. The structure factor is used extensively in X-ray crystallography. It is also used widely in the theory of liquids, as it is related to the radial distribution function. In X-ray crystallography the square of the modulus of the structure factor for a set of crystal planes with Miller indices h, k, l is proportional to the intensity of reflection from these planes.
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