单词 | reflection x-ray microscopy |
释义 | reflection x-ray microscopy [ri`flek·shǝn ¦eks´rā mi`kräs·kǝ·pē] ENGINEERING A technique for producing enlarged images in which a beam of x-rays is successively reflected at grazing incidence, from two crossed cylindrical surfaces; resolution is about 0.5-1 micrometer. |
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