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次级离子质谱
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次级离子质谱
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理学
表面物理学
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secondary ion mass spectrometry, SIMS
次级离子质谱
自20世纪70年代发展起来的一种表面分析技术。
Physics
>化学物理>近代物理方法在化学中的应用>释义
secondary ion mass spectroscopy, SIMS
次级离子质谱
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building materials from soild wastes
building mechanism in a hierarchical manner
building metering of heat-supply system
building model
building operation energy consumption
building optical survey
building overall layout
building performance simulation
building physical performance analysis
building plastics
building problem
building rainwater drainage system
building related illness
building renewal
building safety
building safety protection system
buildings along Yunnan vietnam railroad
building setback
building setting off
building shape measurement
building shrinking
Building Site of Northern Wei Period at Caochangcheng
Building Sites Group at Yuntang-Qizhen
building slope
Buildings of Chinese Eastern Railway
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