“半导体中杂质和缺陷的红外吸收”的概念、定义、翻译、参考文献-科学参考

单词	半导体中杂质和缺陷的红外吸收
释义	半导体中杂质和缺陷的红外吸收 Encyclopedia 工学[光学测量]释 infrared absorption of impurities and defects in semiconductors半导体中杂质和缺陷的红外吸收研究和检测半导体材料中杂质和缺陷的一种技术。
随便看	scanning image dissector scanning imaging scanning imaging FTIR spectromete scanning interferometer scanning ion conductance microscopy scanning ion-conductance microscopy scanning ion-conductance microscopy, SICM scanning lens scanning lidar scanning method scanning mobility particle sizer scanning mobility particle sizer spectrometers scanning modulation collimator scanning near-field optical microscope scanning near field optical microscopy scanning near-field optical microscopy scanning near field optical microscopy (SNOM) scanning near-field optical microscopy (SNOM) scanning near-field optical microscopy, SNOM scanning probe lithography scanning probe microscope scanning probe microscopy scanning probe microscopy, SPM scanning proton microprobe scanning proton microscopy

科学参考收录了854744条科技类词条，基本涵盖了常见科技类参考文献及英语词汇的翻译，是科学学习和研究的有利工具。