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total reflection X-ray fluorescence analysis
释义
total reflection X-ray fluorescence analysis
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核分析技术
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total reflection X-ray fluorescence analysis
全反射X射线荧光分析
一束经过准直的初级X射线以低于或接近于全反射临界角投射到反射体时，产生全反射后再投射到样品，激发样品中被分析元素产生特征X射线荧光，被垂直放置的Si(Li)探测器所检测，实现痕量元素定性和定量分析的X射线荧光分析方法。
Chemistry
＞分析化学＞仪器分析＞释义
total reflection X-ray fluorescence analysis (TRXF)
全反射X射线荧光分析
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